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Etch Press Releases
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12/02/2008 Applied Materials’ New Enabler E5 System Solves Critical Contact Etch Challenges for 32nm Memory Chips 
12/01/2008 Applied Materials Leads the Drive to Accelerate TSV Adoption in 3-Dimensional ICs 
12/01/2008 Applied Materials Delivers High-Performance TSV Etch with Innovative SilviaTM System 
07/14/2008
07/17/2007 Applied Materials' New Carina System Overcomes Barriers to Etching High-k/Metal Gates
07/17/2007
04/17/2007  Applied Materials Delivers Critical 45nm Photomask Etch Technology with New Tetra III System 
04/03/2007 Applied Materials Delivers Record Trench Depths with New Mariana Etch System
12/05/2006 Applied Materials' New Opus AdvantEdge System Maximizes Flash and DRAM Etch Productivity
06/05/2006  Hoya Selects Applied Materials' Tetra Mask Etcher for 65nm Production 
03/28/2006 Applied Materials' AdvantEdge Etch System Selected for Advanced Memory Production
12/06/2005 Applied Materials Delivers Advanced Solutions for Flash Memory Chip Manufacturing
12/06/2005 Applied Materials Introduces AdvantEdge Metal Etch System for Advanced Flash, DRAM Chips
07/12/2005 Applied Materials' New AdvantEdge Etch Cuts Transistor CD Variation by 50% to Wafer's Edge
07/07/2005 Applied Materials' Enabler Etch System Named Best Product by Semiconductor International Magazine 
06/02/2005 Applied Materials' Etch Market Share Jumps in 2004
05/17/2005  Applied Materials Achieves Major Market Share Gains in 2004 
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