| 07/15/2008 |
Applied Materials’ New eHARP System Extends Production-Proven STI Gap-Fill Technology to 32nm and Beyond |
| 05/08/2008 |
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| 08/13/2007 |
Applied Materials' Producer GT Wins Rapid Acceptance, Achieves 100th System Shipment Milestone
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| 06/04/2007 |
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| 05/15/2007 |
Applied Materials Releases Industry's Most Advanced Strain Engineering Technology to Boost 45nm Transistor Speed |
| 11/14/2006 |
Applied Materials Releases the Industry's Most Productive CVD Processing Platform -- the Applied Producer GT |
| 07/11/2006 |
Applied Materials' Black Diamond II Drives Advanced Low k Technology for 45nm Chips |
| 07/10/2006 |
Applied Materials Extends Lithography-Enabling Solutions with New Advanced Patterning Film |
| 07/03/2006 |
Applied Materials' UVision Inspection System and Producer HARP CVD System Win Semiconductor International Awards |
| 11/09/2005 |
Applied Materials Wins 2005 "Best CVD Product" Award from TSMC |
| 07/08/2004 |
Applied Materials Releases Breakthrough Gap-Fill Technology with Applied Producer HARP System |
| 06/15/2004 |
Applied Materials Strengthens Leadership Position in HDP-CVD; Ships 100th 300mm System |
| 05/19/2004 |
Applied Materials Achieves Major CVD Milestone with 750 Applied Producer Systems Shipped |
| 04/22/2004 |
Applied Materials' Black Diamond Low k Wins Best Product Award |
| 03/25/2004 |
Chartered Selects Applied Materials' Advanced Transistor, Low k Interconnect and Inspection Technologies for 300mm Fab |
| 02/04/2004 |
Chipmakers Break Low k Barrier, Take Leap Forward to Drive Next-Generation Electronics Using Applied Black Diamond |
